Home › 2021 › Electrical study of ZnO film thickness effect on the evolution of interface potential barrier of ZnO/p-Si heterojunction: contribution to transport phenomena study

Electrical study of ZnO film thickness effect on the evolution of interface potential barrier of ZnO/p-Si heterojunction: contribution to transport phenomena study

Posted on by fenniche

https://doi.org/10.1016/j.mssp.2021.105971

Posted in 2021

Website Statistics

056942
Users Today : 59
Users Yesterday : 96
This Month : 2315
This Year : 19803
Views Today : 767
Total views : 155243
Who's Online : 1