Home › 2021 › Electrical study of ZnO film thickness effect on the evolution of interface potential barrier of ZnO/p-Si heterojunction: contribution to transport phenomena study

Electrical study of ZnO film thickness effect on the evolution of interface potential barrier of ZnO/p-Si heterojunction: contribution to transport phenomena study

Posted on by fenniche

https://doi.org/10.1016/j.mssp.2021.105971

Posted in 2021

Website Statistics

049711
Users Today : 154
Users Yesterday : 81
This Month : 2256
This Year : 12572
Views Today : 496
Total views : 126949
Who's Online : 4