Home › 2021 › Electrical study of ZnO film thickness effect on the evolution of interface potential barrier of ZnO/p-Si heterojunction: contribution to transport phenomena study

Electrical study of ZnO film thickness effect on the evolution of interface potential barrier of ZnO/p-Si heterojunction: contribution to transport phenomena study

Posted on by fenniche

https://doi.org/10.1016/j.mssp.2021.105971

Posted in 2021

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