Home › 2021 › Electrical study of ZnO film thickness effect on the evolution of interface potential barrier of ZnO/p-Si heterojunction: contribution to transport phenomena study

Electrical study of ZnO film thickness effect on the evolution of interface potential barrier of ZnO/p-Si heterojunction: contribution to transport phenomena study

Posted on by fenniche

https://doi.org/10.1016/j.mssp.2021.105971

Posted in 2021

Website Statistics

097083
Users Today : 255
Users Yesterday : 479
This Month : 4864
This Year : 14436
Views Today : 660
Total views : 253798
Who's Online : 2